JPH075197Y2 - たたみ込みシャッターのスラット回動装置 - Google Patents

たたみ込みシャッターのスラット回動装置

Info

Publication number
JPH075197Y2
JPH075197Y2 JP5687688U JP5687688U JPH075197Y2 JP H075197 Y2 JPH075197 Y2 JP H075197Y2 JP 5687688 U JP5687688 U JP 5687688U JP 5687688 U JP5687688 U JP 5687688U JP H075197 Y2 JPH075197 Y2 JP H075197Y2
Authority
JP
Japan
Prior art keywords
tilter
guide
slat
slide
link mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP5687688U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01162589U (en]
Inventor
勝広 稲野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tachikawa Corp
Original Assignee
Tachikawa Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tachikawa Corp filed Critical Tachikawa Corp
Priority to JP5687688U priority Critical patent/JPH075197Y2/ja
Publication of JPH01162589U publication Critical patent/JPH01162589U/ja
Application granted granted Critical
Publication of JPH075197Y2 publication Critical patent/JPH075197Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Blinds (AREA)
JP5687688U 1988-04-27 1988-04-27 たたみ込みシャッターのスラット回動装置 Expired - Lifetime JPH075197Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5687688U JPH075197Y2 (ja) 1988-04-27 1988-04-27 たたみ込みシャッターのスラット回動装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5687688U JPH075197Y2 (ja) 1988-04-27 1988-04-27 たたみ込みシャッターのスラット回動装置

Publications (2)

Publication Number Publication Date
JPH01162589U JPH01162589U (en]) 1989-11-13
JPH075197Y2 true JPH075197Y2 (ja) 1995-02-08

Family

ID=31282736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5687688U Expired - Lifetime JPH075197Y2 (ja) 1988-04-27 1988-04-27 たたみ込みシャッターのスラット回動装置

Country Status (1)

Country Link
JP (1) JPH075197Y2 (en])

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7148714B2 (en) 1997-06-10 2006-12-12 Cascade Microtech, Inc. POGO probe card for low current measurements
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7148714B2 (en) 1997-06-10 2006-12-12 Cascade Microtech, Inc. POGO probe card for low current measurements
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors

Also Published As

Publication number Publication date
JPH01162589U (en]) 1989-11-13

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